Title :
A complexity-reduced band-limited memory polynomial behavioral model for wideband power amplifier
Author :
Qi Zhang ; Youjiang Liu ; Jie Zhou ; Wenhua Chen
Author_Institution :
Inst. of Electron. Eng., China Acad. of Eng. Phys., Mianyang, China
fDate :
March 30 2015-April 1 2015
Abstract :
Band-limited Volterra series model is an effective way for power amplifier (PA) modeling and digital predistortion (DPD), in the presence of limited DAC/ADC sampling rate. However, it suffers from the issue of requiring very high order baseband band-limiting filter to guarantee the model accuracy, which increases computational complexity drastically. This paper proposes a more efficient band-limited model to reduce the required order of the band-limiting filter significantly, by adding an extra error compensation module into the original band-limited memory polynomial (BLMP) model. A class-AB GaN PA excited by a 60MHz bandwidth orthogonal frequency division multiplexing (OFDM) signal was tested to validate this approach. Experimental results prove that the new model has much lower complexity and higher accuracy than BLMP model.
Keywords :
OFDM modulation; VHF amplifiers; Volterra series; analogue-digital conversion; bandlimited signals; computational complexity; digital-analogue conversion; distortion; error compensation; polynomials; wideband amplifiers; BLMP model; DPD; OFDM signal; band-limited Volterra series model; band-limited memory polynomial model; class-AB gallium arsenide PA; complexity-reduced band-limited memory polynomial behavioral model; computational complexity; digital predistortion; error compensation module; frequency 60 MHz; limited ADC sampling rate; limited DAC sampling rate; orthogonal frequency division multiplexing signal; very high order baseband band-limiting filter; wideband power amplifier; Power amplifiers (PAs); band-limited; digital predistortion (DPD); memory polynomial (MP); orthogonal frequency division multiplexing (OFDM);
Conference_Titel :
Wireless Symposium (IWS), 2015 IEEE International
Conference_Location :
Shenzhen
DOI :
10.1109/IEEE-IWS.2015.7164551