• DocumentCode
    32494
  • Title

    Pacemaker Exposure to High-Power Microwave Ultrawideband Radiation

  • Author

    Bieth, Francois ; Schunck, Therese ; Pinguet, Sylvain ; Delmote, Philippe

  • Author_Institution
    French-German Res. Inst. of SaintLouis, St. Louis, France
  • Volume
    56
  • Issue
    4
  • fYear
    2014
  • fDate
    Aug. 2014
  • Firstpage
    964
  • Lastpage
    969
  • Abstract
    One fundamental issue of the use of high-power microwave (HPM) sources is the health impact, in particular for patients who wear active implantable medical devices (AIMDs). This paper presents the effects of HPM ultrawideband (HPM/UWB) radiation on a pacemaker exposed to them, which is one aspect of the compatibility between HPM sources and AIMDs. The pacemaker was placed inside a phantom and exposed to a pulsed electromagnetic field with a rise time of the order of 100 ps and with an amplitude ranging between 350 kV/m and 1 MV/m. These electromagnetic field amplitudes are much higher than those used in classical scenarios involving HPM/UWB sources. Different configurations and programming modes of the pacemaker were tested. On the whole, the results of the experiments show the relative hardness and reliability of the pacemaker subjected to HPM/UWB radiation. A few nonpermanent disruptions occurred when the pulse repetition frequency and the exposure duration reached 100 Hz and 10 s, respectively.
  • Keywords
    biological effects of microwaves; pacemakers; phantoms; AIMD; HPM sources; active implantable medical devices; classical scenarios; electromagnetic field amplitudes; health impact; high-power microwave ultrawideband radiation; nonpermanent disruptions; pacemaker exposure; phantom; pulsed electromagnetic field; relative hardness; time 10 s; Delays; Electrodes; Electromagnetics; Pacemakers; Phantoms; Rats; Ultra wideband technology; Active implantable medical device (AIMD); high-power microwave (HPM); pacemaker; ultrawideband (UWB);
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2013.2294491
  • Filename
    6689301