• DocumentCode
    3250487
  • Title

    Photo-BJMOSFET Based on SOI Film and Its Analytical Compact Model

  • Author

    Xie, Hai-Qing ; Zeng, Yun ; Zeng, Jian-Ping ; Zhang, Guo-Liang ; Wang, Tai-Hong

  • Author_Institution
    Sch. of Phys. & Microelectron. Sci., Hunan Univ., Changsha, China
  • fYear
    2009
  • fDate
    14-16 Aug. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A novel photoelectric device-photo-BJMOSFET (Bipolar Junction Metal-Oxide-Semiconductor Field Effect Transistor) fabricated on SOI film was proposed in this paper. The photo-BJMOSFET operates in the depletion but not inversion region to decrease dark current. Due to two kinds of carriers (electron and hole) in this device, it is more sensitive than the conventional MOS structure under the same operating conditions and structure parameters. Numerical calculation of the analytical model indicates that photo-BJMOSFET has high sensitivity and SNR (Signal to Noise Ratio). In addition, it can eliminate the high dark current of PN junction under CMOS process, and promise compatibility with CMOS process.
  • Keywords
    MOSFET; photoelectric devices; semiconductor device models; silicon-on-insulator; CMOS process; MOS structure; SOI film; analytical compact model; bipolar junction metal-oxide-semiconductor field effect transistor; dark current; depletion region; photoelectric device-photo-BJMOSFET; photosensitivity; Analytical models; CMOS process; Dark current; Frequency; Gratings; MOSFETs; Microelectronics; Optical films; Semiconductor device noise; Signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics and Optoelectronics, 2009. SOPO 2009. Symposium on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-4412-0
  • Type

    conf

  • DOI
    10.1109/SOPO.2009.5230093
  • Filename
    5230093