• DocumentCode
    3250853
  • Title

    Field emission from semiconductors

  • Author

    Baskin, L.M. ; Fursey, G.N.

  • fYear
    1995
  • fDate
    July 30 1995-Aug. 3 1995
  • Firstpage
    66
  • Abstract
    Summary form only given. A detailed review of the results of experimental and theoretical investigations of field emission from semiconductors, carried out in our laboratory, is presented. Researches of the emission from standard p- and n-type semiconductors (Ge, Si), as well as broad-band semiconductors (CdS) are described. Both stationary emission and the reaction of emission current to pulsed switching the voltage on were explored. Some results of photo-field emission investigations are presented. Specific attention was devoted to the exploration of nonlinear current-voltage characteristics (CVC). It was shown that the non-linearity of the CVC is connected with the limited electron inflow from the bulk of the semiconductor field cathode to the emitting surface.
  • Keywords
    electron field emission; semiconductor materials; semiconductors; CdS; Ge; Si; broad-band semiconductors; field emission; n-type semiconductors; nonlinear current-voltage characteristics; p-type semiconductors; photo-field emission; pulsed voltage switching; Cathodes; Current-voltage characteristics; Electron emission; Electron traps; Filling; Hysteresis; Laboratories; Space charge; Voltage; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
  • Conference_Location
    Portland, OR, USA
  • Print_ISBN
    0-7803-2143-X
  • Type

    conf

  • DOI
    10.1109/IVMC.1995.486991
  • Filename
    486991