DocumentCode
3250853
Title
Field emission from semiconductors
Author
Baskin, L.M. ; Fursey, G.N.
fYear
1995
fDate
July 30 1995-Aug. 3 1995
Firstpage
66
Abstract
Summary form only given. A detailed review of the results of experimental and theoretical investigations of field emission from semiconductors, carried out in our laboratory, is presented. Researches of the emission from standard p- and n-type semiconductors (Ge, Si), as well as broad-band semiconductors (CdS) are described. Both stationary emission and the reaction of emission current to pulsed switching the voltage on were explored. Some results of photo-field emission investigations are presented. Specific attention was devoted to the exploration of nonlinear current-voltage characteristics (CVC). It was shown that the non-linearity of the CVC is connected with the limited electron inflow from the bulk of the semiconductor field cathode to the emitting surface.
Keywords
electron field emission; semiconductor materials; semiconductors; CdS; Ge; Si; broad-band semiconductors; field emission; n-type semiconductors; nonlinear current-voltage characteristics; p-type semiconductors; photo-field emission; pulsed voltage switching; Cathodes; Current-voltage characteristics; Electron emission; Electron traps; Filling; Hysteresis; Laboratories; Space charge; Voltage; Wideband;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
Conference_Location
Portland, OR, USA
Print_ISBN
0-7803-2143-X
Type
conf
DOI
10.1109/IVMC.1995.486991
Filename
486991
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