• DocumentCode
    3250870
  • Title

    Benefits of the lateral resistor in a FED

  • Author

    Levine, J.D.

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    1995
  • fDate
    July 30 1995-Aug. 3 1995
  • Firstpage
    67
  • Lastpage
    71
  • Abstract
    A protective resistor in series with a microtip is known to homogenize field emission. It is not widely recognized, however, that this protective resistor must be fail-safe as well, since the microtips are exposed to rare but potentially destructive events during life. This paper addresses two proposed protective resistor concepts: (a) a vertical resistor located locally underneath each microtip, and (b) a lateral resistor radially distributed from the center of each microtip. It is shown by electrical and thermal analysis that the lateral resistor is significantly more fail-safe than the vertical resistor by factors of about 10/spl times/ and 100/spl times/, respectively.
  • Keywords
    display devices; protection; resistors; vacuum microelectronics; FED; electrical analysis; fail-safe component; field emission display; lateral resistor; microtip; protective resistor; thermal analysis; vertical resistor; Cathodes; Displays; Failure analysis; Gaussian distribution; Instruments; Protection; Resistors; Testing; Thermal factors; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
  • Conference_Location
    Portland, OR, USA
  • Print_ISBN
    0-7803-2143-X
  • Type

    conf

  • DOI
    10.1109/IVMC.1995.486992
  • Filename
    486992