DocumentCode
3250870
Title
Benefits of the lateral resistor in a FED
Author
Levine, J.D.
Author_Institution
Texas Instrum. Inc., Dallas, TX, USA
fYear
1995
fDate
July 30 1995-Aug. 3 1995
Firstpage
67
Lastpage
71
Abstract
A protective resistor in series with a microtip is known to homogenize field emission. It is not widely recognized, however, that this protective resistor must be fail-safe as well, since the microtips are exposed to rare but potentially destructive events during life. This paper addresses two proposed protective resistor concepts: (a) a vertical resistor located locally underneath each microtip, and (b) a lateral resistor radially distributed from the center of each microtip. It is shown by electrical and thermal analysis that the lateral resistor is significantly more fail-safe than the vertical resistor by factors of about 10/spl times/ and 100/spl times/, respectively.
Keywords
display devices; protection; resistors; vacuum microelectronics; FED; electrical analysis; fail-safe component; field emission display; lateral resistor; microtip; protective resistor; thermal analysis; vertical resistor; Cathodes; Displays; Failure analysis; Gaussian distribution; Instruments; Protection; Resistors; Testing; Thermal factors; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
Conference_Location
Portland, OR, USA
Print_ISBN
0-7803-2143-X
Type
conf
DOI
10.1109/IVMC.1995.486992
Filename
486992
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