Title :
Si-MESFET technologies for low drop out regulators
Author :
Wood, Steve ; Lepkowski, William ; Wilk, Seth ; Thornton, Trevor
Author_Institution :
SJT Micropower Inc., Fountain Hills, AZ
Abstract :
Power conditioning circuits based on high breakdown voltage silicon MESFETs are being developed as an alternative to existing approaches that use CMOS or bipolar transistors. Results are presented from simulations of a low drop out (LDO) regulator as an example of the Si-MESFET technology. The LDO regulator exploits the depletion mode behavior of an n-channel MESFET to achieve low drop out voltages with impressive power supply rejection. The high voltage compliance of the Si-MESFETs (5-50V) make them ideally suited for a wide range of commercial and defense related LDO regulator applications.
Keywords :
elemental semiconductors; power MESFET; silicon; voltage regulators; MESFET technology; Si; depletion mode; high breakdown voltage; low drop out voltage regulator; power conditioning circuits; Breakdown voltage; CMOS technology; Circuit simulation; Electric variables; Foundries; MESFETs; Power conditioning; Regulators; Semiconductor device modeling; Silicon;
Conference_Titel :
Telecommunications Energy Conference, 2008. INTELEC 2008. IEEE 30th International
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-2055-1
Electronic_ISBN :
978-1-4244-2056-8
DOI :
10.1109/INTLEC.2008.4664094