DocumentCode :
3251841
Title :
Pulsed laser evaluation of single event transients in optocouplers
Author :
Yingqi, Ma ; Guoqiang, Feng ; Jianwei, Han
Author_Institution :
CSSAR, GUCAS, Beijing, China
fYear :
2009
fDate :
23-26 Jan. 2009
Firstpage :
1
Lastpage :
5
Abstract :
A methodology which used pulsed laser to evaluate the Single Event Transients (SETs) in the optocouplers was proposed. The SETs responses of the optocouplers were firstly investigated with the experimental simulation by pulsed laser test facility. The pulsed laser test data was compared with the ion test data to indicate the veracity and to provide insights into the SETs mechanism. The SETs characters induced by pulsed laser were qualitatively analyzed in model theory.
Keywords :
opto-isolators; radiation effects; experimental simulation; optocouplers; pulsed laser evaluation; pulsed laser test data; pulsed laser test facility; single event transients; Laser modes; Laser theory; Microelectronics; Optical pulse generation; Optical pulses; Semiconductor devices; Semiconductor laser arrays; Semiconductor lasers; Test facilities; Testing; Optocouplers; Pulsed laser evaluation; Single Event Effects; Single event transients;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2009 - 2009 IEEE Region 10 Conference
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-4546-2
Electronic_ISBN :
978-1-4244-4547-9
Type :
conf
DOI :
10.1109/TENCON.2009.5395844
Filename :
5395844
Link To Document :
بازگشت