Title :
Collecting and Analyzing the Intensity Distribution of Diffraction by Computer
Author :
Chen, F.M. ; Tian, J.P. ; Wu, Y. ; Yang, H.X. ; Li, Z.M.
Author_Institution :
Dept. of Math. & Phys., Wuhan Univ. of Sci. & Eng., Wuhan, China
Abstract :
Traditional method of measuring intensity distribution of diffraction (screw-driven photocell method) causes big error. This paper introduced principle, experimental devices and requirements for adjustment of collecting intensity distribution of diffraction by CCD apparatus. The distribution curves of the single-slit and double-slit diffraction with different slit-width are obtained. The relative light intensity and relative light intensity distribution of them are calculated. Compared with the theoretical value, the relative errors are obtained.
Keywords :
CCD image sensors; light diffraction; CCD apparatus; distribution curves; double-slit diffraction; intensity distribution; light intensity; screw-driven photocell method; single-slit diffraction; Capacitance; Charge coupled devices; Diffraction; Distributed computing; Electrical resistance measurement; Gratings; Light sources; Photoconductivity; Shift registers; Signal processing;
Conference_Titel :
Photonics and Optoelectronics, 2009. SOPO 2009. Symposium on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-4412-0
DOI :
10.1109/SOPO.2009.5230185
