• DocumentCode
    325475
  • Title

    Characterization of indirectly measurable antenna balun/impedance-matching device

  • Author

    Lu, Y. ; Lee, T.W. ; Teo, K.M.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
  • Volume
    3
  • fYear
    1998
  • fDate
    21-26 June 1998
  • Firstpage
    1323
  • Abstract
    This paper presents a novel approach for the S-parameter characterization of an indirectly measurable antenna balun/impedance-matching device. A back-to-back measurement set-up is proposed and a system of complex variable nonlinear equations is derived to relate the measurable undesired parameters and the unmeasurable desired parameters. Then the genetic algorithm (GA) is proposed to solve the system of complex variable nonlinear equations to obtain the desired S-parameters. Unlike conventional GA, the chromosomes in our approach are represented directly by complex numbers instead of normal binary coding. The representation of chromosome in complex number increases the efficiency and flexibility of GA in engineering applications. With the GA-solved S-parameters, we are able to characterize the antenna input impedances. The simulated and measured results of the antenna system show that the proposed GA approach is valid and this approach can also be extended to some other indirect measurement.
  • Keywords
    S-parameters; antenna accessories; baluns; electric impedance; genetic algorithms; impedance matching; nonlinear equations; two-port networks; S-parameter characterization; antenna input impedances; back-to-back measurement set-up; chromosomes; complex variable nonlinear equations; genetic algorithm; indirectly measurable antenna balun/impedance-matching device; Antenna measurements; Biological cells; Coaxial components; Genetics; Impedance matching; Impedance measurement; Nonlinear equations; Poles and towers; Scattering parameters; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1998. IEEE
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-4478-2
  • Type

    conf

  • DOI
    10.1109/APS.1998.690740
  • Filename
    690740