• DocumentCode
    3255048
  • Title

    Influence of thermal degradation of synthetic polymers (EPR, EPDM) on electrical characteristics

  • Author

    Zaharescu, T. ; Giurginca, M.

  • Author_Institution
    Res. & Design Inst. for Electr. Eng., Bucharest, Romania
  • fYear
    1995
  • fDate
    10-13 Jul 1995
  • Firstpage
    472
  • Lastpage
    476
  • Abstract
    Electrical characteristics: dielectric constant, dielectric loss and volume resistivity were measured and correlated with structural changes induced by heating in water at three temperatures (40°, 60° and 80°C). IR and electrical determinations prove that oxygenated products decrease the material quality by worsening useful parameters. Degradation effects represent the contribution of products like alcohols and ketones to electrical behaviour of elastomers. These compounds act as dipoles, whose concentrations influence the electrical properties. The damage product level depends on the formation route. During the first stage of ageing the measured characteristics increased. After a long heating time, chemical attack tends to diminish the insulation behaviour of studied elastomers
  • Keywords
    ageing; dielectric losses; elastomers; electrical resistivity; environmental degradation; ethylene-propylene rubber; infrared spectra; permittivity; spectrochemical analysis; 40 degC; 60 degC; 80 degC; 800 hour; EPDM; EPR; IR determination; ageing; alcohols; chemical attack; damage product level; dielectric constant; dielectric loss; elastomers; electrical behaviour; electrical characteristics; electrical determination; electrical properties; heating; insulation behaviour; ketones; oxygenated products; structural change; synthetic polymers; thermal degradation; volume resistivity; Conductivity; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Electric variables; Paramagnetic resonance; Polymers; Thermal degradation; Water heating;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Solid Dielectrics, 1995. ICSD'95., Proceedings of the 1995 IEEE 5th International Conference on
  • Conference_Location
    Leicester
  • Print_ISBN
    0-7803-2040-9
  • Type

    conf

  • DOI
    10.1109/ICSD.1995.523031
  • Filename
    523031