Title :
In-flight measurement of space radiation effects on commercial DRAM
Author :
Sasada, Takeshi ; Ichikawa, Satoshi ; Kana, Toshiki
Author_Institution :
Japan Aerosp. Exploration Agency, Japan
Abstract :
To evaluate the characteristics of commercial memory devices, Japan Aerospace Exploration Agency (JAXA) launched a solid state recorder (SSR) on the mission demonstration test satellite-1 (MDS-1 or "Tsubasa") into geo-stationary transfer orbit (GTO) in February 2002. Passing through the Van Allen Belt exposed MDS-1 to severe radioactive rays in every orbit. This flight experiment measured the rate of single-event-upsets (SEUs) on a large number of stacked 64 Mbit dynamic random access memory (DRAM), and the distribution of total ionizing dose (TID) effects. As a result, we can calculate the actual SEU rate, and we confirmed the capabilities of two types of on-the-fly error detection and correction (EDAC) mechanisms. This paper presents the results of the space experiment of SSR, especially focusing on SEU analysis.
Keywords :
DRAM chips; aerospace testing; artificial satellites; error correction; error detection; radiation hardening (electronics); recorders; DRAM; Japan Aerospace Exploration Agency; Tsubasa satellite; Van Allen Belt; dynamic random access memory; error correction mechanism; error detection mechanism; geostationary transfer orbit; in-flight measurement; memory device characteristics; mission demonstration test satellite-1; radioactive rays; single event upsets; solid state recorder; space radiation effects; total ionizing dose; Aerospace testing; Belts; DRAM chips; Error correction; Extraterrestrial measurements; Orbital calculations; Radiation effects; Random access memory; Single event transient; Solid state circuits;
Conference_Titel :
Microelectronics, 2004. ICM 2004 Proceedings. The 16th International Conference on
Print_ISBN :
0-7803-8656-6
DOI :
10.1109/ICM.2004.1434703
