• DocumentCode
    3257204
  • Title

    SU8 Adhesive Bonding using Contact Imprinting

  • Author

    Yu, Liming ; Iliescu, C. ; Tay, F.E.H. ; Chen, Bangtao

  • Author_Institution
    Inst. of Bioeng. & Nanotechnol.
  • Volume
    1
  • fYear
    2006
  • fDate
    27-29 Sept. 2006
  • Firstpage
    189
  • Lastpage
    192
  • Abstract
    The present work proposes an adhesive bonding technique, at wafer level, using SU-8 negative photoresist as intermediate layer. The adhesive was selective imprint on one of the bonding surface. The main applications are in microfluidic area where a low temperature bonding is required. The method consists of three major steps. First the adhesive layer is deposited on one of the bonding surface by contact imprinting from a dummy wafer where the SU-8 photoresist was initially spun, or from a teflon cylinder. Second, the wafers to be bonded are placed in contact and aligned. In the last step, the bonding process is performed at temperatures between 100degC and 200degC, a pressure of 1000 N in vacuum on a classical wafer bonding system. The results indicate a low stress value induced by the bonding technique. In the same time the process presents a high yield: 95-100%. The technique was successfully tested in the fabrication process of a dielectrophoretic device
  • Keywords
    adhesive bonding; low-temperature techniques; microfluidics; photoresists; wafer bonding; SU-8 negative photoresist; SU8 adhesive bonding technique; bonding surface; contact imprinting; dielectrophoretic device; dummy wafer; low temperature bonding; microfluidic area; teflon cylinder; wafer bonding system; Bonding processes; Dielectrophoresis; Fabrication; Microfluidics; Resists; Stress; Temperature; Testing; Vacuum systems; Wafer bonding; SU-8 photoresist; adhesive bonding; contact imprinting; wafer-to-wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    International Semiconductor Conference, 2006
  • Conference_Location
    Sinaia
  • Print_ISBN
    1-4244-0109-7
  • Type

    conf

  • DOI
    10.1109/SMICND.2006.283965
  • Filename
    4063192