Title :
Error propagation with different VNA calibration techniques at millimeter frequencies
Author :
Shoaib, Nosherwan ; Sellone, M. ; Ferrero, Alessandro ; Oberto, L. ; Brunetti, L.
Author_Institution :
Electromagn. Div., Ist. Naz. di Ricerca Metrol. - INRIM, Turin, Italy
Abstract :
This paper describes the scattering parameters magnitude measurement and uncertainty comparison using different vector network analyzer (VNA) calibration algorithms at millimeter frequencies with WR10 (75 to 110 GHz) waveguides. The state of the art two port calibration algorithms Thru-Reflect-Line (TRL) and Quick Short-Open-Load-Thru (QSOLT) are considered in this comparison. The dimensional measurements for Shim WR10 are also carried out.
Keywords :
calibration; measurement uncertainty; millimetre wave measurement; network analysers; Shim WR10; VNA calibration techniques; WR10 waveguides; error propagation; frequency 75 GHz to 110 GHz; magnitude measurement; millimeter frequencies; quick short-open-load-thru; thru-reflect-line; two port calibration algorithms; uncertainty comparison; vector network analyzer calibration algorithms; Calibration; Frequency measurement; Measurement uncertainty; Ports (Computers); Scattering parameters; Standards; Uncertainty; Measurement uncertainty evaluation; scattering parameters; two port network analyzers; vector network analyzer calibration; waveguide;
Conference_Titel :
Microwave Measurement Conference, 2013 82nd ARFTG
Conference_Location :
Columbus, OH
DOI :
10.1109/ARFTG-2.2013.6737351
