A methodology to reduce the computational cost of behavioral test pattern generation

Author

Santucci, Jean-François ; Dray, Gérard ; Giambiasi, Norbert ; Boumédine, Marc

Author_Institution

Lab. d´´Etudes et de Recherche en Inf., Nimes, France

fYear

1992

fDate

8-12 Jun 1992

Firstpage

267

Lastpage

272

Abstract

The authors present different methods of computing testability measures for behavioral descriptions of digital circuits. The computation of testability measures based on the work described has been implemented and integrated into a behavioral deterministic test pattern generator to study the effectiveness of the proposed testability measures. The internal model derived from behavioral descriptions is presented. The main features of a behavioral test pattern generation algorithm that was implemented are described. The definition of controllability and observability of the basic elements of the internal model is given. Experiments performed on test generation are described, and the results are summarized

Keywords

controllability; logic testing; observability; behavioral test pattern generation; computational cost; controllability; observability; testability measures; Automatic testing; Circuit faults; Circuit testing; Computational efficiency; Controllability; Decision trees; Digital circuits; Life estimation; Observability; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference, 1992. Proceedings., 29th ACM/IEEE

Conference_Location

Anaheim, CA

ISSN

0738-100X

Print_ISBN

0-8186-2822-7

Type

conf

DOI

10.1109/DAC.1992.227824

Filename

227824