• DocumentCode
    3258293
  • Title

    Improved Linearity CMOS Active Resistor with Increased Frequency Response and Controllable Equivalent Resistance

  • Author

    Popa, C. ; Manolescu, A.M. ; Manolescu, A.

  • Author_Institution
    Fac. of Electron., Telecommun. & Inf. Technol., Univ. Politehnica of Bucharest
  • Volume
    2
  • fYear
    2006
  • fDate
    27-29 Sept. 2006
  • Firstpage
    355
  • Lastpage
    358
  • Abstract
    A new active resistor circuit is further presented, with main advantages of improved linearity, small area consumption and improved frequency response. An original technique for linearizing the I(V) characteristic of the active resistor is proposed, based on the simulation of the Ohm law using two linearized differential amplifiers, a multiplier and a current-pass circuit. The controllability of the active resistor circuit is given by the possibility of modifying the value of the equivalent resistance by changing the ratio of a control voltage and a control current. Additionally, the value of the simulated resistance is independent on technological parameters, with the result of improving the circuit accuracy. The errors introduced by the second-order effects is also strongly reduced, while the area consumption of the active resistor is minimized by replacing the classical MOS transistor with FGMOS (floating gate MOS) devices
  • Keywords
    CMOS analogue integrated circuits; MIS devices; equivalent circuits; frequency response; resistors; CMOS active resistor; FGMOS devices; MOS transistor; Ohm law; controllable equivalent resistance; current-pass circuit; floating gate MOS; frequency response; linearity error; linearized differential amplifiers; multiplier; second-order effects; CMOS technology; Circuit simulation; Controllability; Differential amplifiers; Frequency response; Linearity; MOSFETs; Radio control; Resistors; Voltage control; active resistor; differential amplifiers; linearity error; second-order effects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    International Semiconductor Conference, 2006
  • Conference_Location
    Sinaia
  • Print_ISBN
    1-4244-0109-7
  • Type

    conf

  • DOI
    10.1109/SMICND.2006.284018
  • Filename
    4063246