3259802

Efficient Output Esd Protection Of High-speed Sram Ic With Well-coupled Technique In Sub-pm Cmos Technology

Chau-Neng Wu ; Ming-Dou Ker ; Yu, T.-L.

1997

3-5 June 1997

40

43

CMOS integrated circuits; CMOS process; CMOS technology; Electrostatic discharge; High speed integrated circuits; MOS devices; Protection; Random access memory; Resistors; Voltage;

English

ieee

VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on

Taipei, Taiwan

1524-766X

0-7803-4131-7

conf

10.1109/VTSA.1997.614723

614723