DocumentCode :
3259807
Title :
Modeling and analysis of factors of size effect in micro-cutting: The tool geometry and the depth of cutting
Author :
Jing, X.B. ; Lin, Bo ; Zhang, David Wei
Author_Institution :
Sch. of Mech. Eng., Tianjin Univ., Tianjin, China
fYear :
2013
fDate :
26-30 Aug. 2013
Firstpage :
314
Lastpage :
318
Abstract :
Based on the finite element approach and the strain gradient (SG) theory, this paper produced a study on factors of size effect and minimum cutting thickness phenomenon in the micro-cutting process. Mechanisms of micro-cutting focusing on its characteristics that include size effect, tool edge radius and minimum cutting thickness has been studied. A new constitutive relationship based on SG theory is formulated to model the size effect of material properties at micro-scale. The new constitutive was implanted into the FEM, and size effect was investigated. From the result of simulation, it is indicated that size effect in micro-cutting could be well formulated by SG theory. The curve of material properties is approached to curve of JC with the depth cutting increased; when the rake angle is increased, the size effect is more obvious. The tool edge radius has a significant influence on the size effect. Result show that the cause of the minimum chip thickness is the tool edge radius.
Keywords :
cutting; cutting tools; finite element analysis; micromachining; FEM; SG theory; cutting depth; cutting thickness; cutting tool edge radius; cutting tool geometry; finite element method; microcutting; size effect; strain gradient theory; Equations; Finite element analysis; Manufacturing; Materials; Mathematical model; Strain; Stress; Minimum chip thickness; constitutive relationship; micro-cutting; size effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2013 International Conference on
Conference_Location :
Suzhou
Print_ISBN :
978-1-4799-1210-0
Type :
conf
DOI :
10.1109/3M-NANO.2013.6737440
Filename :
6737440
Link To Document :
بازگشت