• DocumentCode
    3260176
  • Title

    Modelling of complex interconnect structures

  • Author

    Rustagi, Aayush ; Jain, Kanika

  • Author_Institution
    ECE, JIITU, Noida, India
  • fYear
    2009
  • fDate
    23-26 Jan. 2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Analytical model has been proposed of complex interconnect structure with ten metal strips in different layers. All the capacitative components have been computed to measure the total value of capacitance. Comparative study has been undertaken to have a model with least area occupancy as well as less value of total capacitance. We have proposed a complex interconnect geometry to overcome the major problems of area occupancy and the total capacitance.
  • Keywords
    integrated circuit interconnections; analytical model; capacitative components; complex interconnect geometry; complex interconnect structure modelling; conformal mapping; metal strips; Analytical models; Area measurement; Capacitance; Dielectrics; Geometry; Integrated circuit interconnections; Integrated circuit modeling; Solid modeling; Strips; Wires; Fringe capacitance; conformal mapping; overlap and lateral capacitance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2009 - 2009 IEEE Region 10 Conference
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-4546-2
  • Electronic_ISBN
    978-1-4244-4547-9
  • Type

    conf

  • DOI
    10.1109/TENCON.2009.5396240
  • Filename
    5396240