• DocumentCode
    326136
  • Title

    FDTD formalism including a microstrip inside an elementary cell

  • Author

    Grando, J. ; Michielsen, B. ; Issac, F. ; Alliot, J.C.

  • Author_Institution
    ONERA, Chatillon, France
  • Volume
    1
  • fYear
    1998
  • fDate
    21-26 June 1998
  • Firstpage
    528
  • Abstract
    Analysing microwave millimeter-wave integrated circuits (MMIC) with the FDTD technique can require a large computation space, and, as a consequence, a long computation time. With this technique, accurate frequency responses are obtained by the Fourier transform of very long time domain records. A classical way to lower the computation time is to apply linear, or non-linear, predictors, to short time domain records. We propose another method to lower the computation time: this method consists in reducing the computation space by introducing a formalism of a microstrip inside an elementary cell. We have applied the above formalism to the determination of the S/sub 21/ parameter for the classical double-stub filter. For the computation, the filter is enclosed in a PEC parallelepipedic cavity. This formalism is similar to the thin wire formalism previously introduced by Holland and Simpson (1981).
  • Keywords
    finite difference time-domain analysis; microstrip circuits; microstrip filters; microwave integrated circuits; millimetre wave integrated circuits; passive filters; FDTD; Fourier transform; MMIC; Maxwell equations; computation space reduction; computation time; double-stub filter; elementary cell; frequency responses; linear predictors; microstrip inside; microwave millimeter-wave integrated circuits; nonlinear predictors; time domain records; Circuit analysis computing; Filters; Finite difference methods; Fourier transforms; Frequency; MMICs; Microstrip; Microwave theory and techniques; Millimeter wave integrated circuits; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1998. IEEE
  • Conference_Location
    Atlanta, GA, USA
  • Print_ISBN
    0-7803-4478-2
  • Type

    conf

  • DOI
    10.1109/APS.1998.699194
  • Filename
    699194