• DocumentCode
    3262010
  • Title

    Curve fitting based test method for integrated circuit simulation

  • Author

    Dan, Song ; Xiaolin, Zhang

  • Author_Institution
    The School of Electronics and Information Engineering, Beijing University of Aeronautics and Astronautics, Beijing, 100083, China. Email: buaasd@ee.buaa.edu.cn
  • fYear
    2007
  • fDate
    3-4 June 2007
  • Firstpage
    226
  • Lastpage
    229
  • Abstract
    A test method for the integrated circuit(IC) simulation is presented. Perl language and OCEAN language were used in the simulation to generate automatically a group of adequate and accurate testing files. Thousands of long-playing simulations were accomplished as a batch from a nongraphic remote terminal. According to the vast simulation results, figures were drawn, line fitting was completed by the least square method, and useful information was extracted. The simulation shows that the solution could be much more efficient, effective, accurate and convenient.
  • Keywords
    Circuit simulation; Circuit testing; Curve fitting; Data mining; Electronic equipment testing; Integrated circuit modeling; Integrated circuit testing; Least squares methods; Oceans; Open source software; OCEAN; Perl; fitting; integrated circuit(IC); least square method; simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Semiconductor Technology, 2007. EDST 2007. Proceeding of 2007 International Workshop on
  • Conference_Location
    Tsinghua University
  • Print_ISBN
    1-4244-1098-3
  • Electronic_ISBN
    1-4244-1098-3
  • Type

    conf

  • DOI
    10.1109/EDST.2007.4289816
  • Filename
    4289816