DocumentCode
3262010
Title
Curve fitting based test method for integrated circuit simulation
Author
Dan, Song ; Xiaolin, Zhang
Author_Institution
The School of Electronics and Information Engineering, Beijing University of Aeronautics and Astronautics, Beijing, 100083, China. Email: buaasd@ee.buaa.edu.cn
fYear
2007
fDate
3-4 June 2007
Firstpage
226
Lastpage
229
Abstract
A test method for the integrated circuit(IC) simulation is presented. Perl language and OCEAN language were used in the simulation to generate automatically a group of adequate and accurate testing files. Thousands of long-playing simulations were accomplished as a batch from a nongraphic remote terminal. According to the vast simulation results, figures were drawn, line fitting was completed by the least square method, and useful information was extracted. The simulation shows that the solution could be much more efficient, effective, accurate and convenient.
Keywords
Circuit simulation; Circuit testing; Curve fitting; Data mining; Electronic equipment testing; Integrated circuit modeling; Integrated circuit testing; Least squares methods; Oceans; Open source software; OCEAN; Perl; fitting; integrated circuit(IC); least square method; simulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices and Semiconductor Technology, 2007. EDST 2007. Proceeding of 2007 International Workshop on
Conference_Location
Tsinghua University
Print_ISBN
1-4244-1098-3
Electronic_ISBN
1-4244-1098-3
Type
conf
DOI
10.1109/EDST.2007.4289816
Filename
4289816
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