DocumentCode
3262124
Title
An intrinsically robust technique for fault tolerance under multiple upsets
Author
Lisboa, C.A.L. ; Carro, Luigi
Author_Institution
Departamento de Engenharia Eletrica, Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
fYear
2004
fDate
12-14 July 2004
Firstpage
180
Abstract
In this study, the use of stochastic operators for the design of inherently robust circuits for future technologies is proposed, being an alternative to conventional digital arithmetic operators.
Keywords
circuit reliability; combinational circuits; digital arithmetic; fault tolerance; logic design; stochastic processes; SEU; arithmetic stochastic operators; combinational circuits; digital arithmetic operators; fault tolerance; inherently robust circuits; microelectronics reliability; multiple upsets; soft errors; Circuit noise; Computer errors; Electromagnetic transients; Fault tolerance; Pulse circuits; Robustness; Semiconductor device noise; Single event transient; Stochastic processes; Stochastic resonance;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2004. IOLTS 2004. Proceedings. 10th IEEE International
Print_ISBN
0-7695-2180-0
Type
conf
DOI
10.1109/OLT.2004.1319682
Filename
1319682
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