Real time RHEED evaluation with the help of image processing

In this paper, the reflection high-energy electron diffraction (RHEED) pattern during the nano structure formation with the help of image processing is investigated. Nowadays, the growth of self-organised nano structures has been intensively investigated. It is very important to understand their growth process and the knowledge about their shape is particularly significant. The growth of these nano structures can be tracked in-situ manner with the help of RHEED. In-situ information about the stage of the process and the shape of the structure has been provided by RHEED. The temporal relation between the formation of the nano structure and the RHEED pattern is rather complicate. The image processing of the RHEED pattern help us to recognize and to interpret the metamorposis of the pattern during the growth process.