DocumentCode
3264546
Title
Laser degradation, important understandings for product manufacturing
Author
Chu, S.N.G.
Author_Institution
Bell Labs., Lucent Technol., Murray Hill, NJ, USA
Volume
2
fYear
1997
fDate
10-13 Nov 1997
Firstpage
99
Abstract
Degradation of laser diodes during normal operation or under accelerated aging testing occurs at the weak links of the device structures. By identifying these weak links and understanding their degradation mechanisms, the material structure as well as the device design can be improved
Keywords
laser reliability; life testing; semiconductor device manufacture; semiconductor lasers; accelerated aging testing; degradation mechanisms; device design; laser degradation; laser diodes; material structure; normal operation; product manufacturing; weak links; Accelerated aging; Degradation; Diode lasers; Electrostatic discharge; Manufacturing; Paper technology; Semiconductor device manufacture; Semiconductor lasers; Stress; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE
Conference_Location
San Francisco, CA
ISSN
1092-8081
Print_ISBN
0-7803-3895-2
Type
conf
DOI
10.1109/LEOS.1997.645278
Filename
645278
Link To Document