• DocumentCode
    3264622
  • Title

    A Fabry-Perot microinterferometer for visible wavelengths

  • Author

    Raley, N.F. ; Ciarlo, D.R. ; Koo, J.C. ; Beiriger, B. ; Trujillo, J. ; Yu, C. ; Loomis, G. ; Chow, R.

  • Author_Institution
    Lawrence Livermore Nat. Lab., CA, USA
  • fYear
    1992
  • fDate
    22-25 June 1992
  • Firstpage
    170
  • Lastpage
    173
  • Abstract
    The authors report on their efforts to develop a silicon-based microinterferometer for optical applications in the visible spectral region using micromachining fabrication techniques. The interferometer is formed by two parallel dielectric mirrors supported on membranes which are electrostatically deflected for wavelength control. A simplified two-wafer fabrication process was designed and investigated. They obtained 250 nm membrane deflection for an applied voltage of 100 V. Hafnium dioxide-silicon dioxide dielectric mirrors with high reflectivity and low stress were fabricated on membrane supports and also free-standing. Anticipated applications include microinstrument spectroscopy systems for atomic absorption, ellipsometry, imaging, optical fiber communications, and general spectrophotometer uses as well as accelerometry.<>
  • Keywords
    elemental semiconductors; light interferometers; micromechanical devices; mirrors; optical workshop techniques; semiconductor technology; silicon; 100 V; Fabry-Perot microinterferometer; HfO/sub 2/-SiO/sub 2/; Si; accelerometry; atomic absorption; dielectric mirrors; ellipsometry; etching; imaging; integrated optics; masks; membranes; micromachining fabrication; optical fiber communications; optical resonators; parallel dielectric mirrors; spectrophotometer; spectroscopy; two-wafer fabrication; visible spectral region; Biomembranes; Dielectrics; Fabry-Perot; Hafnium; Micromachining; Mirrors; Optical device fabrication; Optical interferometry; Process design; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensor and Actuator Workshop, 1992. 5th Technical Digest., IEEE
  • Conference_Location
    Hilton Head Island, SC, USA
  • Print_ISBN
    0-7803-0456-X
  • Type

    conf

  • DOI
    10.1109/SOLSEN.1992.228299
  • Filename
    228299