Title :
Possibility Of MMIC On Si: The Lossy Substrate Issue
Author :
Chin, A. ; Prinslow, D. ; Tsai, V. ; Nasserbakht, G. ; Eklun, B.
Keywords :
Capacitors; Inductors; MMICs; MOSFETs; Radio frequency; Resistors; Scattering parameters; Semiconductor process modeling; Substrates; Transmission line measurements;
Conference_Titel :
VLSI Technology, Systems, and Applications, 1997. Proceedings of Technical Papers. 1997 International Symposium on
Conference_Location :
Taipei, Taiwan
Print_ISBN :
0-7803-4131-7
DOI :
10.1109/VTSA.1997.614747