• DocumentCode
    3265122
  • Title

    The role of ACTIVEX and COM in ATE

  • Author

    Fertitta, Kirk G. ; Harvey, John M.

  • Author_Institution
    Vektrex Electron. Syst., San Diego, CA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    35
  • Lastpage
    51
  • Abstract
    The Component Object Model (COM) is an object-oriented standard for reusable binary components. COM reusability is based not only on component reuse, but on interface reuse. Client programs access COM objects only through defined interfaces, which may be reused from object to object. Interfaces hide implementation details (encapsulation). Interface reuse and inheritance provide runtime polymorphism. Interfaces can be precisely described with type libraries to development environments, and can be accessed remotely with little additional effort. COM technology has incredible potential for ATE. This paper focuses on ways that COM will be used to transform instrument driver technology, and on the resulting benefits for test systems in general. Runtime polymorphism supports syntactical interchangeability. The SCPI Consortium and the IVI Foundation are currently pursuing technologies that promise to deliver this level of interchangeability to the ATE market. COM will also provide natural solutions for driver deployment/integration, remote access, and a variety of other benefits as well. Ultimately COM will be used “in the box” to combine the functionality of driver and firmware
  • Keywords
    automatic test equipment; automatic test software; client-server systems; distributed object management; inheritance; object-oriented programming; open systems; peripheral interfaces; software reusability; software standards; virtual instrumentation; ACTIVEX role; ATE; COM reusability; COM role; component reuse; development environments; firmware; inheritance; instrument driver technology; interface reuse; legacy support; object-oriented standard; remote access; reusable binary components; runtime polymorphism; syntactical interchangeability; type libraries; Encapsulation; Hardware; Instruments; Kirk field collapse effect; Libraries; Microprogramming; Object oriented modeling; Programming; Runtime; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
  • Conference_Location
    San Antonio, TX
  • ISSN
    1080-7725
  • Print_ISBN
    0-7803-5432-X
  • Type

    conf

  • DOI
    10.1109/AUTEST.1999.800354
  • Filename
    800354