• DocumentCode
    3265255
  • Title

    Carrier induced partial screening of piezoelectric field in strained InGaAsP based quantum wells grown on (111) substrate

  • Author

    Kim, Sangin ; Gopinath, Anand

  • Author_Institution
    Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
  • Volume
    2
  • fYear
    1997
  • fDate
    10-13 Nov 1997
  • Firstpage
    144
  • Abstract
    Theoretically and experimentally, it has been shown that the strained heterostructures grown on polar substrates, which an oriented on axes other than the [100], have piezoelectric fields due to off-diagonal components of strain, and the internal electric fields result in a redshift of the excitonic transitions within the strained heterostructures. Based on this, several groups have demonstrated a tunable blueshift of the absorption edge by modulating the internal fields with an external reverse bias in strained piezoelectric quantum well (QW) diodes. The experimental determination of partial screening of the piezoelectric fields under forward biased current injection has been also demonstrated. In this paper, we report theoretical study of this screening in strained InGaAsP based QW grown on (111) substrate and its gain spectrum under current injection
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; piezoelectric semiconductors; semiconductor quantum wells; InGaAsP; absorption edge; carrier induced partial screening; current injection; excitonic transition; gain spectrum; internal electric field; piezoelectric field; polar (111) substrate; quantum well diode; redshift; strained heterostructure; tunable blueshift; Absorption; Capacitive sensors; Charge carrier processes; Differential equations; Eigenvalues and eigenfunctions; Lattices; Matrix converters; Piezoelectric materials; Quantum mechanics; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1997. LEOS '97 10th Annual Meeting. Conference Proceedings., IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    1092-8081
  • Print_ISBN
    0-7803-3895-2
  • Type

    conf

  • DOI
    10.1109/LEOS.1997.645313
  • Filename
    645313