Title :
VXI synchro/resolver measurement and simulation COTS hardware for commercial airline industry ATE
Author :
Johnson, Michael W.
Author_Institution :
North Atlantic Instrum. Inc., Bohemia, NY, USA
Abstract :
This paper describes Rockwell Collins airline industry automatic test equipment (ATE) and a North Atlantic Instruments (NAI) VXI commercial-off-the-shelf (COTS) tester card. The Collins ATE is used for testing seller furnished equipment (SFE) and buyer furnished equipment (BFE) in accordance with industry standard ARINC 608A requirements. The NAI VXI Synchro/Resolver simulation and measurement card is a module of both the SFE and the BFE ATE. Collins ITS-701 general-purpose digital emphasis tester is used to test SFE such as the automatic flight director system, maintenance access terminal and standby instruments. Its RFT-1000 general purpose RF emphasis tester is used to test BFE such as the RF sensors, HF transceiver and SATCOM units. NAI´s model 5390 is a precision Synchro/Resolver simulation and angle position measurement VXI COTS tester card interfacing to rugged reliable synchros, the 5390 functionality is based upon highly accurate synchro-to-digital conversion and digital-to-synchro simulation
Keywords :
aerospace simulation; aircraft instrumentation; aircraft testing; automatic test equipment; digital simulation; electronic equipment testing; peripheral interfaces; transducers; ARINC 608A; ATE; COTS; HF transceiver; RF sensors; SATCOM; VXI synchro/resolver measurement; angle position measurement; automatic flight director; commercial airline industry; commercial-off-the-shelf tester card; digital-to-synchro simulation; industry standard; maintenance access terminal; measurement card; simulation; standby instruments; synchro-to-digital conversion; Automatic test equipment; Automatic testing; Hafnium; Hardware; Instruments; Maintenance; Position measurement; Radio frequency; System testing; Transceivers;
Conference_Titel :
AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-5432-X
DOI :
10.1109/AUTEST.1999.800378