Automated testing of high speed high resolution, A to D converters

This paper describes an automated test set designed and built to test a 14 bit, 5.2 MHz A/D using a sinusoidal input. The familiar transfer function plots for integral nonlinearity are obtained by using a sine wave-to-linear transformation instead of the traditional stepped ramp input. Each of the software functions that process the input sine wave data to produce the analytical output data will be detailed, and the test results will be presented in graphical form. The INL, DNL and frequency domain plots will be interpreted for 14 bit A/Ds running at multiple sampling frequencies