DocumentCode :
3266100
Title :
P1522: a formal standard for testability and diagnosability measures
Author :
Kaufman, Mark ; Sheppard, John
Author_Institution :
NWAS, Corona, CA, USA
fYear :
1999
fDate :
1999
Firstpage :
411
Lastpage :
418
Abstract :
Members of the Maintenance and Diagnostic Control subcommittee of IEEE´s Standards Coordinating Committee 20 (SCC20) are developing a standard for testability and diagnosability characteristics and metrics. The objective of this standard, P1522, is to provide notionally correct, useful, and mathematically precise definitions of testability measures that may be used to either measure or predict the testability of a system. Notionally correct means that the measures are not in conflict with intuitive and historical representations. The end purpose is to provide an unambiguous source for definitions of testability and diagnosability metrics. In this paper, we present a summary of the work completed so far on P1522 and a roadmap for its completion. We cover the organization of the standard, the sources of the measures, how these measures relate to the other AI-ESTATE standards, and information modeling
Keywords :
IEEE standards; automatic test equipment; design for testability; diagnostic expert systems; fault diagnosis; production testing; AI-ESTATE standards; IEEE P1522; completion roadmap; diagnosability measures; fault isolation; formal standard; information modeling; intelligent test environment; knowledge representation; production testing; testability measures; trial use standard; Artificial intelligence; Control systems; Degradation; Electrical equipment industry; Electronic equipment testing; Government; Measurement standards; Standards development; Standards organizations; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON '99. IEEE Systems Readiness Technology Conference, 1999. IEEE
Conference_Location :
San Antonio, TX
ISSN :
1080-7725
Print_ISBN :
0-7803-5432-X
Type :
conf
DOI :
10.1109/AUTEST.1999.800409
Filename :
800409
Link To Document :
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