DocumentCode :
32683
Title :
Real-Time Voltage and Resistance Features in Microprobe Testing Process
Author :
Qing Yuan ; Lei Han ; Junhui Li ; Dasong Ge
Author_Institution :
State Key Lab. of High Performance Complex Manuf., Central South Univ., Changsha, China
Volume :
5
Issue :
2
fYear :
2015
fDate :
Feb. 2015
Firstpage :
274
Lastpage :
278
Abstract :
A testing circuit of probe is designed to understand the real-time characteristics of the probe during testing process. The constant resistance voltage and probe voltage are measured simultaneously by DSOX2022A oscilloscope, and the real-time resistance of probe is calculated. The result shows that the probe resistance varies from the initial infinity to approximately $1~Omega $ at 0.2 ms when the probe is in contact with the copper substrate. The resistance of the probe is gradually reduced to relatively stable value with the increasing of compressed displacement. The probe resistance increases badly in initial 30 times testing when the angle between probe and copper changes from 0° to 2°, and reduces to a stable value after 20-30 times testing.
Keywords :
circuit testing; constant resistance voltage; microprobe testing process; probe resistance; probe voltage; real-time characteristics; testing circuit; time 0.2 ms; Copper; Educational institutions; Probes; Resistance; Substrates; Testing; Voltage measurement; Angle; contact resistance; oscilloscope; probe; probe.;
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2015.2389834
Filename :
7018042
Link To Document :
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