Title :
Spread spectrum clock generator for reducing Electro-Magnetic Interference (EMI) noise in LCD driver IC
Author :
Ko, Jaehong ; Lee, Seungjung ; Kim, Doyoon ; Kim, KiJoon ; Chang, Kye-Eon
Author_Institution :
SAMSUNG Electron., Yongin
Abstract :
In this paper, we describe EMI noise reduction in LCD driver IC of which uses the spread spectrum clock generator. The proposed spread spectrum clock generator use pseudo random modulation technique for providing clock edge offset with coarsely and use fine selecting that make numerous time-offset in each coarse-offset signal. As a result of spread spectrum technique, the original clock edges which are used in LCD driver IC has been spread in time domain maximally about 3 n sec. Moreover the proposed SSCG has analog bias in delay circuit for the immunity of power supply variation. The LCD driver IC including proposed spread spectrum clock generator has been fabricated with one poly three metal 0.45 mum CMOS technology when the logic supply voltage varies from 2.3 V to 3.6 V and the driver supply voltage varies from 8 V to 13.5 V. The 6 pieces of test chips have been assembled to 17" LCD monitor, and have been under tested in anechoic chamber which has been surrounded with absorbers. As a test result, we achieved that the EMI noise levels of newly designed LCD driver IC have been reduced about 3 dBu at harmonic frequency of the system clock comparing with conventional one.
Keywords :
CMOS integrated circuits; clocks; delay circuits; driver circuits; electromagnetic interference; interference suppression; liquid crystal displays; CMOS technology; EMI noise reduction; LCD driver IC; LCD monitor; absorbers; anechoic chamber; clock edge offset; clock edges; coarse-offset signal; delay circuit; driver supply voltage; electromagnetic interference reduction; power supply variation immunity; pseudo random modulation; spread spectrum clock generator; voltage 2.3 V to 3.6 V; voltage 8 V to 13.5 V; CMOS technology; Clocks; Driver circuits; Electromagnetic interference; Integrated circuit noise; Integrated circuit testing; Logic testing; Noise generators; Noise reduction; Spread spectrum communication;
Conference_Titel :
Circuits and Systems, 2007. MWSCAS 2007. 50th Midwest Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
978-1-4244-1175-7
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2007.4488751