DocumentCode :
3269625
Title :
Fast EPI based depth for plenoptic cameras
Author :
Uliyar, Mithun ; Putraya, Gururaj ; Basavaraja, S.V.
Author_Institution :
Nokia Res. Center, Bangalore, India
fYear :
2013
fDate :
15-18 Sept. 2013
Firstpage :
1
Lastpage :
4
Abstract :
We present a depth estimation method for light field cameras by making use of Epipolar Plane Image (EPI) representations of the microlens sub images. Light field raw image structure has several sub images and generally depth is estimated using multi baseline techniques or object labeling schemes. Both these approaches are quite complex. EPI representation of the sub images when applied to the multi-baseline framework provides outputs comparable to that of the multi-baseline approach along with significant reduction in complexity (50%). Fast depth estimation will become an important requirement as plenoptic cameras gets into the main stream. The proposed method has been tested on a couple of datasets captured with different light field camera setups and was found to perform as well as the multi-baseline approach in terms of quality of the depth map generated but taking only half of the computational time.
Keywords :
image classification; image representation; EPI representation; complexity reduction; computational time; depth map; epipolar plane image; fast depth estimation method; light field cameras; light field raw image structure; microlens sub images; multibaseline techniques; object labeling schemes; plenoptic cameras; Arrays; Cameras; Complexity theory; Estimation; Lenses; Microoptics; Strips; Depth; EPI; Light field; Plenoptic;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2013 20th IEEE International Conference on
Conference_Location :
Melbourne, VIC
Type :
conf
DOI :
10.1109/ICIP.2013.6738001
Filename :
6738001
Link To Document :
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