• DocumentCode
    3270763
  • Title

    A Temperature and Reliability Oriented Simulation Framework for Multi-core Architectures

  • Author

    Corbetta, Simone ; Zoni, Davide ; Fornaciari, William

  • Author_Institution
    Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy
  • fYear
    2012
  • fDate
    19-21 Aug. 2012
  • Firstpage
    51
  • Lastpage
    56
  • Abstract
    The increasing complexity of multi-core architectures demands for a comprehensive evaluation of different solutions and alternatives at every stage of the design process, considering different aspects at the same time. Simulation frameworks are attractive tools to fulfil this requirement, due to their flexibility. Nevertheless, state-of-the-art simulation frameworks lack a joint analysis of power, performance, temperature profile and reliability projection at system-level, focusing only on a specific aspect. This paper presents a comprehensive estimation framework that jointly exploits these design metrics at system-level, considering processing cores, interconnect design and storage elements. We describe the framework in details, and provide a set of experiments that highlight its capability and flexibility, focusing on temperature and reliability analysis of multi-core architectures supported by Network-on-Chip interconnect.
  • Keywords
    integrated circuit interconnections; integrated circuit reliability; multiprocessing systems; multiprocessor interconnection networks; network-on-chip; comprehensive estimation framework; comprehensive evaluation; design metrics; design process; interconnect design; joint analysis; multicore architectures; network-on-chip interconnect; processing cores; reliability analysis; reliability oriented simulation framework; reliability projection; state-of-the-art simulation frameworks; storage elements; system-level; temperature oriented simulation framework; temperature profile; Computational modeling; Computer architecture; Degradation; Estimation; Microarchitecture; Reliability engineering; Multi-core; Reliability; Simulation; Thermal;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI (ISVLSI), 2012 IEEE Computer Society Annual Symposium on
  • Conference_Location
    Amherst, MA
  • ISSN
    2159-3469
  • Print_ISBN
    978-1-4673-2234-8
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2012.22
  • Filename
    6296447