• DocumentCode
    3270990
  • Title

    Dynamic growth process of W-nano-branched structure on insulator substrate studied with transmission electron microscopy

  • Author

    Song, M. ; Mitsuishi, K. ; Furuya, K.

  • Author_Institution
    National Inst. for Mater. Sci., Tsukuba, Japan
  • fYear
    2005
  • fDate
    25-28 Oct. 2005
  • Firstpage
    156
  • Abstract
    Controllable fabrication of nanostructure is important and necessary to application of nanomaterials in technology. Among the methods of fabrication of nanostructures, electron-beam-induced deposition (EBID) is a promising method. A transmission electron microscope (TEM), JEM-2010F operated at 200 kV, was used for fabrication of nanowires and nano-branched structures. Thin film samples Of SiO2 or Al2O3 were used as substrates. Tungsten hexacarbonyl (W(CO)6) powder was used as a precursor. The base pressure in column is lower than 2 × 10-5 Pa. A gas introducing system which has a nozzle with an inner diameter smaller than 0. 1 mm and a reservoir of powder gas-source was used. The fabricated structures were characterized in-situ or after the fabrication with JEM-2010F TEM. All the experiments were performed at room temperature. Nanowires in diameter of about 3 nm nucleate on surface of substrate after starting the electron irradiation with intensity lower than 0.75 A/cm2. They nucleate and grow within the all area electron beam irradiated. They grow almost normally to the surface of the substrate with distances of several nanometers between each other.
  • Keywords
    aluminium compounds; electron beam deposition; nanostructured materials; nanotechnology; nanowires; silicon compounds; substrates; transmission electron microscopy; Al2O3; SiO2; W-nanobranched structure; dynamic growth process; electron-beam-induced deposition; insulator substrate; nanostructures; nanowires; transmission electron microscopy; Fabrication; Insulation; Nanomaterials; Nanostructures; Nanowires; Powders; Substrates; Transistors; Transmission electron microscopy; Tungsten;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2005 International
  • Print_ISBN
    4-9902472-2-1
  • Type

    conf

  • DOI
    10.1109/IMNC.2005.203785
  • Filename
    1595261