Noise immunity characteristics of dual-slope integrating analog-digital converters

In this study, the noise immunity characteristics of dual slope integrating analog-digital converters (DSI-ADCs) are discussed. It is shown that circuit malfunctions mainly occur on the digital block of the DSI-ADC and are classified into the following three types: “(a) the counter data are rewritten to a larger number due to the integration time error”, “(b) the counter data are rewritten to smaller number due to the integration time error”, and “(c) the counter itself upsets”