Title :
A High-Performance Foldback Current Limiting Circuit for Improving Regulators´ Latch-up Effect
Author :
Xiaojie, Cheng ; Xin, Wu
Author_Institution :
Res. Inst., CETC, Guangzhou
Abstract :
An over-current protection circuit for improving the integrated regulators´ latch-up effect is proposed. Latch-up effect can be eliminated through combining foldback function with constant current limiting function which could change the slope of the foldback current curve to avoid intersecting the static load line. With normal 0.6 mum CMOS process, the feasibility and reliability of the circuit was proved
Keywords :
CMOS integrated circuits; circuit reliability; current limiters; overcurrent protection; 0.6 micron; 0.6 mum CMOS process; circuit reliability; current limiting circuit; foldback function; integrated regulators latch-up effect; over-current protection circuit; Automobiles; CMOS process; Circuits; Current limiters; Equations; MOSFETs; Power dissipation; Protection; Regulators; Threshold voltage;
Conference_Titel :
Communications, Circuits and Systems Proceedings, 2006 International Conference on
Conference_Location :
Guilin
Print_ISBN :
0-7803-9584-0
Electronic_ISBN :
0-7803-9585-9
DOI :
10.1109/ICCCAS.2006.285125
