• DocumentCode
    327384
  • Title

    On the thermooxidative degradation of polyethyleneterephtalate

  • Author

    Chipara, M.D. ; Notingher, P.V. ; Reyes, J.R. ; Chipara, M.I.

  • Author_Institution
    Inst. for Electrotech. Res., Bucharest, Romania
  • fYear
    1998
  • fDate
    22-25 Jun 1998
  • Firstpage
    283
  • Lastpage
    285
  • Abstract
    The thermal degradation in air of PET within the glass transition range is a complex phenomenon. According to mechanical data it might be concluded that the thermooxidative degradation of PET is described by a single first order process. Due to the thickness of the sample and as the degradation temperatures were above TA, the thermooxidative degradation process is homogeneous. Thermal analysis have revealed the presence of a weak liquid-liquid transition. Both the liquid-liquid transition and the glass transition depends on degradation time and temperature. From the effect of the thermooxidative degradation on TG, it is possible to conclude that at low degradation temperatures the polymer crosslinks. At 150°C, a transition from crosslinking to chain scissions at large degradation times (above 500 h) is noticed. Hence Tc depends on the degradation time and temperature. Dc electrical conduction measurements have revealed two competing first order relaxation processes, ascribed to crystalline and amorphous domains. Further studies are in course, in order to elucidate this behaviour
  • Keywords
    glass transition; organic insulating materials; oxidation; polymers; thermal analysis; PET; chain scission; crosslinking; electrical conduction; glass transition; liquid-liquid transition; polyethyleneterephtalate; polymer; relaxation process; thermal analysis; thermooxidative degradation; Acceleration; Glass; Ionizing radiation; Physics; Polymers; Positron emission tomography; Rapid thermal processing; Temperature dependence; Temperature distribution; Thermal degradation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Solid Dielectrics, 1998. ICSD '98. Proceedings of the 1998 IEEE 6th International Conference on
  • Conference_Location
    Vasteras
  • Print_ISBN
    0-7803-4237-2
  • Type

    conf

  • DOI
    10.1109/ICSD.1998.709280
  • Filename
    709280