Title :
A new similarity measure for microarray data analysis
Author :
Lam, Benson S Y ; Yan, Hong
Author_Institution :
Dept. of Electron. Eng., City Univ. of Hong Kong, China
Abstract :
A number of clustering algorithms have been used for microarray data analysis. However, the performance of these methods is significantly degraded due to the presence of noise. In this paper, we introduce a robust clustering algorithm based on a new similarity measure. The key concept of the new similarity measure is to measure the similarity between two data points by their sub-dimensions. For example, assume that x1, x2 and x3 are 10 dimensional data vectors. The data point X3 is said to be closer to x1 than x2 if more than half of the dimensions of x1 and x3 are closer to x1 than X2. Thus, if two patterns are very similar except a small amount of features or noise, this measure will preserve the similarity. Experimental results show that the clustering algorithm using this measure produces better results than commonly used similarity measures.
Keywords :
biology computing; data analysis; genetics; pattern clustering; clustering algorithms; microarray data analysis; similarity measure; Clustering algorithms; Clustering methods; Data analysis; Data engineering; Degradation; Fungi; Gene expression; Noise measurement; Noise robustness; Prototypes;
Conference_Titel :
Intelligent Signal Processing and Communication Systems, 2005. ISPACS 2005. Proceedings of 2005 International Symposium on
Print_ISBN :
0-7803-9266-3
DOI :
10.1109/ISPACS.2005.1595446