• DocumentCode
    3274697
  • Title

    Nanocrystalline copper and nickel as ultra high-density chip-to-package interconnections

  • Author

    Bansal, S. ; Saxena, Ankur ; Tummala, Rao R.

  • Author_Institution
    NSF Microsystems Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    2
  • fYear
    2004
  • fDate
    1-4 June 2004
  • Firstpage
    1647
  • Abstract
    Nanocrystalline (nc) copper and nickel are being explored as candidate interconnect materials for nanoscale interconnections to meet the requirements of fine pitch, superior electrical and mechanical performance while also catering to the environmental and cost concerns. Bulk nanocrystalline copper and nickel (99.999% purity) specimens of average grain size of about 50 nm were prepared by equichannel angular extrusion (ECAE). Both micro- and nanohardness measurements showed a significant increase in the hardness of the bulk specimens. The grain size analysis shows that copper is stable up to 100°C and the activation energy for grain growth was calculated to be around 35 KJ/mol. The nickel specimens were found to be stable up to 250°C. The tensile strength of these materials has been found to be 5-6 times of the conventional microcrystalline forms and the fracture toughness, JIC, values for nc- copper and nickel have been found to be 21.66 KJ/m2 and 12.13 KJ/m2, respectively, which are high for these strength levels indicating considerable capacity for plastic deformation in these materials prior to fracture.
  • Keywords
    Young´s modulus; copper; fatigue; fine-pitch technology; fracture toughness; grain growth; grain size; integrated circuit interconnections; integrated circuit packaging; microhardness; nanoelectronics; nanostructured materials; nickel; plastic deformation; Cu; Ni; activation energy; elastic modulus; equichannel angular extrusion; fatigue behavior; fine pitch; fracture toughness; grain growth; grain size; microhardness; nanocrystalline interconnect materials; nanohardness; nanoscale interconnections; off-chip interconnections; plastic deformation; tensile strength; ultrahigh-density chip-to-package interconnections; Copper; Creep; Electric resistance; Environmentally friendly manufacturing techniques; Fatigue; Grain size; Lead; Nanostructured materials; Nickel; Packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2004. Proceedings. 54th
  • Print_ISBN
    0-7803-8365-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2004.1320336
  • Filename
    1320336