Title :
Dielectric Relaxation Behavior of PEEK during the Loss of the Coolant Accident
Author :
Kim, K.Y. ; Lee, C. ; Ryu, B.H.
Author_Institution :
Korea Atomic Energy Research Institute, Jeongup, Chonbuk, Korea. E-mail: kykim2@kaeri.re.kr
Abstract :
Dielectric relaxation behavior of poly(etheretherketone) (PEEK) during the loss of coolant accident (LOCA) was investigated. The result of the temperature dependency of the dielectric properties indicated that the glass transition temperature of the aged PEEK increased as increasing radiation doses and thermal ageing time. The relaxation intensity calculated using Cole-Cole´s circular arc could be useful for the evaluation of the PEEK degradation.
Keywords :
Accelerated aging; Accidents; Coolants; Crystalline materials; Dielectric losses; Dielectrics and electrical insulation; Electric resistance; Temperature dependence; Thermal degradation; Thermal resistance;
Conference_Titel :
Solid Dielectrics, 2007. ICSD '07. IEEE International Conference on
Conference_Location :
Winchester, UK
Print_ISBN :
1-4244-0750-8
Electronic_ISBN :
1-4244-0751-6
DOI :
10.1109/ICSD.2007.4290762
