Title :
Nanoscale infrared&THz mapping of conductivity
Author :
Keilmann, Fritz ; Hillenbrand, Rainer
Author_Institution :
Center for Nanosci., Max-Planck-Inst. fur Biochem., Munchen
Abstract :
Near-field microscopy of scattering type (s-SNOM) has well-known merits in chemical recognition at 20-nm spatial resolution, using infrared vibrational-fingerprint resonances of molecules or crystal lattices. Here we report on s-SNOM application in semiconductor technology and correlated-metal physics, performed both at 10 mum and 118 mum wavelength.
Keywords :
electrical conductivity measurement; infrared imaging; nanotechnology; near-field scanning optical microscopy; semiconductor technology; submillimetre wave imaging; THz mapping; chemical recognition; conductivity; correlated-metal physics; infrared vibrational-fingerprint resonances; nanoscale infrared mapping; near-field microscopy; s-SNOM; scattering type; semiconductor technology; wavelength 10 mum; wavelength 118 mum; Atomic force microscopy; Chemicals; Conducting materials; Conductivity; Infrared imaging; Infrared spectra; Optical microscopy; Optical scattering; Scanning electron microscopy; Spectroscopy;
Conference_Titel :
Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on
Conference_Location :
Pasadena, CA
Print_ISBN :
978-1-4244-2119-0
Electronic_ISBN :
978-1-4244-2120-6
DOI :
10.1109/ICIMW.2008.4665621
