• DocumentCode
    3276957
  • Title

    Thermal characterization of flat silicon heat pipes

  • Author

    Lai, A. ; Gillot, C. ; Ivanova, M. ; Avenas, Y. ; Louis, C. ; Schaeffer, C. ; Fournier, E.

  • Author_Institution
    CEA-DRT, Grenoble, France
  • fYear
    2004
  • fDate
    9-11 Mar 2004
  • Firstpage
    21
  • Lastpage
    25
  • Abstract
    The miniaturization and improving performance of electronic devices lead to increasing power densities. Consequently, the thermal environment has become a main issue in their performance and reliability. The use of flat miniature heat pipes is investigated to conduct the heat over distances or to spread it over a larger surface area avoiding hot spots on the device The interest of silicon etching techniques for heat pipe manufacturing is that such heat pipes can be very compact, very light and have a better hydraulic behavior than metallic heat pipes. In this paper the structure of a flat silicon grooved heat pipe is presented. Then an experimental study investigates power limitations of a realized prototype. The capillary limit is in the range 20-30 W depending on the working temperature.
  • Keywords
    heat transfer; semiconductor device reliability; silicon; thermal management (packaging); electronic devices; flat Si heat pipes; hydraulic behavior; improving performance; increasing power densities; miniaturization; reliability; thermal characterization; Electronic packaging thermal management; Etching; Manufacturing; Prototypes; Silicon; Space heating; Temperature distribution; Thermal conductivity; Thermal management; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2004. Twentieth Annual IEEE
  • ISSN
    1065-2221
  • Print_ISBN
    0-7803-8363-X
  • Type

    conf

  • DOI
    10.1109/STHERM.2004.1291296
  • Filename
    1320447