DocumentCode :
32775
Title :
Design and Characterization of Polarization-Reversed AlInGaN Based Ultraviolet Light-Emitting Diode
Author :
Yi-An Chang ; Yu-Rui Lin ; Jih-Yuan Chang ; Tsun-Hsin Wang ; Yen-Kuang Kuo
Author_Institution :
Dept. of Phys., Nat. Changhua Univ. of Educ., Changhua, Taiwan
Volume :
49
Issue :
6
fYear :
2013
fDate :
Jun-13
Firstpage :
553
Lastpage :
559
Abstract :
The effect of using polarization-reversed AlInGaN-based quantum well active region in ultraviolet light-emitting diode is numerically investigated. By employing Al0.54In0.26Ga0.20N and Al0.83In0.17N as barrier and electron blocking layers, which ably reverse the direction of the polarization in Al0.005In0.02Ga0.975N quantum well and provide sufficient potential barrier height to confine electrons in the conduction band, simulation results show that the energy band profile of the Al0.005In0.02Ga0.975N quantum well is tilted up, resulting in better carrier confinement and more uniform distribution of carriers in the quantum well. Moreover, the overlap between electron and hole wave functions is increased and the Auger recombination is suppressed effectively, which in turn improves the radiative recombination efficiency.
Keywords :
Auger effect; III-V semiconductors; aluminium compounds; conduction bands; gallium compounds; indium compounds; light emitting diodes; optical design techniques; quantum well devices; semiconductor quantum wells; wave functions; wide band gap semiconductors; Al0.005In0.02Ga0.975N; Al0.54In0.26Ga0.20N-Al0.83In0.17N; Auger recombination; barrier layer; carrier confinement; conduction band; electron blocking layer; electron confinement; energy band profile; hole wave functions; optical design; polarization-reversed based ultraviolet light-emitting diode; polarization-reversed quantum well; potential barrier height; radiative recombination efficiency; Aluminum gallium nitride; Charge carrier processes; Current density; Light emitting diodes; Materials; Radiative recombination; AlInGaN; numerical simulation; reversed polarization; ultraviolet light-emitting diodes;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2013.2259467
Filename :
6507317
Link To Document :
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