A statistical model to describe invariants extracted from a 3-D quadric surface patch and its applications in region-based recognition

Author

Wang, G.Y. ; Houkes, Z. ; Regtien, P.P.L. ; Korsten, M.J. ; Ji, G.R.

Author_Institution

Ocean Univ. of Qingdao, China

Volume

1

fYear

1998

fDate

16-20 Aug 1998

Firstpage

668

Abstract

A statistical model, describing noise-disturbed invariants extracted from a surface patch of a range image, has been developed and applied to region based pose estimation and classification of 3D quadrics. The Mahalanobis distance, which yields the same results as a Baysian classifier, is used for the classification of the surface patches. The results, compared with the Euclidean distance, appear to be much more reliable

Keywords

Bayes methods; image classification; noise; statistical analysis; 3D quadric classification; 3D quadric surface patch; Baysian classifier; Euclidean distance; Mahalanobis distance; invariants extraction; noise-disturbed invariants; region based pose estimation; region-based recognition; statistical model; Data acquisition; Eigenvalues and eigenfunctions; Electrical capacitance tomography; Machine vision; Oceans; Read only memory; Sea measurements; Sea surface; Statistics; Surface fitting;

fLanguage

English

Publisher

ieee

Conference_Titel

Pattern Recognition, 1998. Proceedings. Fourteenth International Conference on

Conference_Location

Brisbane, Qld.

ISSN

1051-4651

Print_ISBN

0-8186-8512-3

Type

conf

DOI

10.1109/ICPR.1998.711232

Filename

711232