Title :
Determination of FIR laser wavelength using precise refractive index measurement method of optical etalon
Author :
Nakayama, K. ; Matsubara, A. ; Kaneba, T. ; Okajima, S. ; Kawahata, K. ; Tanaka, T. ; Tokuzawa, T. ; Akiyama, T. ; Ohkuma, H.
Author_Institution :
Chubu Univ., Kasugai
Abstract :
A far-infrared (FIR) laser wavelength has been determined from refractive index of silicon with high resistivity (~2.8 kOmega-cm). A wavelength of a 48-mum CH3OD laser pumped by continuous wave (cw) 9R(8) CO2 laser has been measured at five significant figures. The wavelength and the refractive index are 47.661 plusmn 0.005 mum and 3.4147 at 9.6degC, 3.4164 at 19.4degC, and 3.4180 at 28.8degC. A known wavelength of a 97-mum CH3OH laser pumped by cw 9R(10) CO2 laser has been also measured by using this technique.
Keywords :
elemental semiconductors; gas lasers; light interferometers; optical pumping; refractive index; silicon; submillimetre wave lasers; CO2; CO2 laser; far-infrared laser wavelength; laser pumped; optical etalon; optical sources; refractive index; silicon; temperature 19.4 degC; temperature 28.8 degC; temperature 9.6 degC; wavelength 48 mum; wavelength 97 mum; Conductivity; Finite impulse response filter; Laser excitation; Optical pumping; Optical refraction; Optical variables control; Pump lasers; Refractive index; Silicon; Wavelength measurement;
Conference_Titel :
Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on
Conference_Location :
Pasadena, CA
Print_ISBN :
978-1-4244-2119-0
Electronic_ISBN :
978-1-4244-2120-6
DOI :
10.1109/ICIMW.2008.4665747
