Title :
Design of safety-critical ASICs
Author :
Amble, Anthony P. ; Zimme, Robert ; Hunter, Alan ; Dear, Ian D.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Abstract :
This paper will describe the design and development of an ASIC for use in safety-critical applications. The functionality was confirmed by means of commercially available formal verification tools that were also used to verify the built-in self-test, and the impact of the self-test upon the basic functionality. Self-test was used to give 100% stuck-at fault coverage
Keywords :
application specific integrated circuits; built-in self test; circuit CAD; design for testability; fault diagnosis; formal verification; integrated circuit testing; built-in self-test; formal verification tools; functionality; safety-critical ASICs; self-test; stuck-at fault coverage; Application software; Application specific integrated circuits; Built-in self-test; Digital relays; Inductors; Logic; Manufacturing processes; Power system protection; Protective relaying; Safety;
Conference_Titel :
AUTOTESTCON '98. IEEE Systems Readiness Technology Conference., 1998 IEEE
Conference_Location :
Salt Lake City, UT
Print_ISBN :
0-7803-4420-0
DOI :
10.1109/AUTEST.1998.713413
