Polarization information for terahertz imaging

Author

Zhang, Yan ; Zhang, Ranxi ; Cui, Ye ; Sun, Wenfeng

Author_Institution

Dept. of Phys., Capital Normal Univ., Beijing

fYear

2008

fDate

15-19 Sept. 2008

Firstpage

1

Lastpage

2

Abstract

A method to analyze the variety of the polarization state of terahertz (THz) wave by using a typical electro-optic sampling setup with <110> zinc-blende (ZnTe) crystal as a sensor is presented. To illustrate the knowledge of polarization of the THz pulse, the function of THz detect in ZnTe crystal is interpreted. Two kinds of Jones matrixes, birefringence device and polarizer device, are used to analyses the polarization change of the THz electric field vector caused by the sample. It was found that the THz polarization imaging is sensitive to the edge of the samples.

Keywords

II-VI semiconductors; electromagnetic wave polarisation; submillimetre wave imaging; terahertz wave detectors; terahertz wave imaging; Jones matrix; THz electric field vector; THz polarization imaging; ZnTe; birefringence; electro-optic sampling setup; polarizer; sensor; zinc-blende ZnTe crystal; Birefringence; Electromagnetic scattering; Electromagnetic wave absorption; High-resolution imaging; Light scattering; Microwave imaging; Optical imaging; Plastics; Polarization; Zinc compounds;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on

Conference_Location

Pasadena, CA

Print_ISBN

978-1-4244-2119-0

Electronic_ISBN

978-1-4244-2120-6

Type

conf

DOI

10.1109/ICIMW.2008.4665865

Filename

4665865