Title :
Novel Flash Memory Cell with a Channel Multi-Gate Transistor
Author :
Wang, W.C. ; Ko, Y.-H. ; Tang, M. ; Chang, S.T.
Keywords :
Channel hot electron injection; Electronics industry; FinFETs; Flash memory cells; Hot carrier injection; Industrial electronics; Low voltage; Nonvolatile memory; Silicon; Threshold voltage;
Conference_Titel :
Semiconductor Device Research Symposium, 2005 International
Print_ISBN :
1-4244-0083-X
DOI :
10.1109/ISDRS.2005.1595998
