DocumentCode :
3284179
Title :
Contact erosion patterns of Pd material in DC breaking arcs
Author :
Chen, Zhuan-Ke ; Mizukoshi, Hiroaki ; Sawa, Koichiro
Author_Institution :
Dept. of Electr. Eng., Keio Univ., Yokohama, Japan
fYear :
1993
fDate :
27-29 Sep 1993
Firstpage :
69
Lastpage :
76
Abstract :
Arc erosion patterns of pure Pd contacts tested with switching inductive loads at 20 V, 1.0~4.0 A were determined by means of SEM and material transfer was measured with an electronic balance. Three types of erosion patterns were observed at the different load current regions. Firstly, distributed craters occurred on the anode and scattered redeposited mounds surrounded by sprayed particles on the cathode when the current was less than about 2.5 A, which we called a critical transition current because it demonstrates the change of metal transfer direction; secondly, if the current was larger than the critical current value, pips occurred on the anode and craters on the cathode; thirdly, when the current was around the critical current value, both pips and craters co-existed either on the cathode or on the anode. The behaviours of electrical contact resistance and arc duration in the metallic phase and the gaseous phase at different load currents are reported. The particle sputtering-depositing model is presented and used to explain the mechanism of material transfer processes and the formation of erosion patterns. The material transfer direction is affected by the arc duration of the metallic phase as well as the gaseous phase. The electrical contact resistance not only depends on the surface films and surface morphology, but is also influenced by the particle sputtering
Keywords :
arcs (electric); circuit-breaking arcs; contact resistance; electrical contacts; erosion; palladium; 1.0 to 4.0 A; 20 V; DC breaking arcs; Pd; Pd material; SEM; arc duration; contact erosion patterns; craters; critical current; electrical contact resistance; electronic balance; material transfer; mounds; particle sputtering-depositing model; switching inductive loads; Anodes; Cathodes; Contact resistance; Critical current; Electric resistance; Electronic equipment testing; Materials testing; Particle scattering; Surface morphology; Surface resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1993., Proceedings of the Thirty-Ninth IEEE Holm Conference on
Conference_Location :
Pittsburgh, PA
Print_ISBN :
0-7803-1270-8
Type :
conf
DOI :
10.1109/HOLM.1993.489662
Filename :
489662
Link To Document :
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